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uv vis diffuse reflectance spectroscopy drs  (JASCO Inc)


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    JASCO Inc uv vis diffuse reflectance spectroscopy drs
    <t>(a)</t> <t>UV–vis</t> <t>diffuse-reflectance</t> spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.
    Uv Vis Diffuse Reflectance Spectroscopy Drs, supplied by JASCO Inc, used in various techniques. Bioz Stars score: 99/100, based on 24317 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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    uv vis diffuse reflectance spectroscopy drs - by Bioz Stars, 2026-05
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    Images

    1) Product Images from "Elucidating the Origin of Hidden Limitations in Ru-Complex/Ag/Polymeric Carbon Nitride Hybrid Photocatalysts for Visible-Light CO 2 Reduction"

    Article Title: Elucidating the Origin of Hidden Limitations in Ru-Complex/Ag/Polymeric Carbon Nitride Hybrid Photocatalysts for Visible-Light CO 2 Reduction

    Journal: Journal of the American Chemical Society

    doi: 10.1021/jacs.5c21374

    (a) UV–vis diffuse-reflectance spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.
    Figure Legend Snippet: (a) UV–vis diffuse-reflectance spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.

    Techniques Used: Irradiation, Filtration



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    uv vis diffuse reflectance spectroscopy drs  (JASCO Inc)
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    <t>(a)</t> <t>UV–vis</t> <t>diffuse-reflectance</t> spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.
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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
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    Image Search Results


    (a) UV–vis diffuse-reflectance spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.

    Journal: Journal of the American Chemical Society

    Article Title: Elucidating the Origin of Hidden Limitations in Ru-Complex/Ag/Polymeric Carbon Nitride Hybrid Photocatalysts for Visible-Light CO 2 Reduction

    doi: 10.1021/jacs.5c21374

    Figure Lengend Snippet: (a) UV–vis diffuse-reflectance spectra of Al 2 O 3 , RuP (66 μmol g –1 )/Al 2 O 3 , and RuCP (66 μmol g –1 )/Al 2 O 3 , FT-IR spectra of (b) RuP (66 μmol g –1 )/Al 2 O 3 , and (c) RuCP (66 μmol g –1 )/Al 2 O 3 before and after irradiation (1.1 mW cm –2 ) at 400 nm for 1 h under a CO 2 atmosphere. The FT-IR spectra of the samples were recorded immediately after the suspended solids were collected by filtration and washed with diethyl ether several times. The measurements were completed within approximately 3 min after filtration.

    Article Snippet: The prepared materials were characterized by nuclear magnetic resonance (NMR) (JEOL ECA400II) ( 1 H; 400 MHz and 31 P; 168 MHz), X-ray diffraction (XRD) (MiniFlex600, Rigaku; Cu–Kα radiation), UV–vis diffuse-reflectance spectroscopy (DRS) (V-565, Jasco), and Fourier transform infrared (FT-IR) spectroscopy (FT-IR-610, Jasco).

    Techniques: Irradiation, Filtration

    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.

    Journal: Nature Communications

    Article Title: Single-crystalline Ba x Sr 1-x TaO 2 N solid-solution photocatalyst with low defect concentrations for solar-driven water splitting

    doi: 10.1038/s41467-026-68848-9

    Figure Lengend Snippet: a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.

    Article Snippet: UV–visible diffuse reflectance spectroscopy (DRS) data were recorded using a UV-visible spectrometer (V-670, JASCO system).

    Techniques: Electron Microscopy, Synthesized, Transmission Assay, Spectroscopy